Test Sockets
Spire Manufacturing offers test socket with the highest electrical and mechanical performance, ensuring global semiconductor manufactures and test houses the most stable and reliable contactors. Our test sockets covers a wide range of applications. For high performance device testing, delivering the accuracy that characterization deserves and the reliability that production demands, we are your solution.
General Description
• Package size: Excellent and precision solution for fine pitch device test
• Socket base: Custom-made design to fit test device
• Contact type: Spring Probe/PCR
• Bandwidth: 200MHz~16GHz
• Pitch: Available Ranging from 0.15mm to 0.30mm
• Socket Types: BGA, QFP, LGA and QFN
| Pitch | Bandwidth @ -1dB | Inductance | CRES/100K insertions | Life |
| 0.50 mm | 16 GHz | 0.2 – 0.6 nH from 0.5 - 20.1Ghz | 15.3mΩ Average +/- 10 mΩCpk 1.04 | 1M+ |
| 0.80 mm | 16 GHz | 0.2 – 0.6 nH from 0.5 - 20.1Ghz | 15.3mΩ Average +/- 10 mΩCpk 1.04 | 1M+ |
| 1.00 mm | 16 GHz | 0.2 – 0.8 nH from 0.5 - 20.1Ghz | 12mΩ, 3σ @ 50K cycles =0.5mΩ | 1M+ |
| 1.27 mm | 16 GHz | 0.3 – 0.8 nH from 0.5 - 20.1Ghz | 12mΩ,3σ @ 50K cycles =0.5mΩ | 1M+ |
Applications
• Engineering test & Validation
• Product Characterization
• Volume Manufacturing with Test Handler
• Product Verification
• Burn-In with test
• BIST & DFT
• -55 °C to +155°C Testing
• 0.5mm to 1.27mm Device Pitch
• Standard PCB Footprint
• 1 to 4 weeks lead time
• Economical Socket for High volume testing
• Standard and Pb Free available
If you are interested in learning more of our services & support, please contact your Spire Manufacturing sales representative.